
a) Bright field TEM micrograph of a typical particle in the sample. b), d) and e) SAD patterns acquired along the [011], [2-11] and [110] zone axes, respectively. c) and f) electron microdiffraction acquired along the [101] and [100] zone axes, respectively. The reflections indicated in the patterns were identified by simulations done with the JEMS software, using the neutron data presented in the previous sections.
auto-cropped from the OCR Markdown crop box (stage B); materials and kind to be reviewed in Phase 1